- Series :
- Part Status :
- Operating Temperature :
- Supplier Device Package :
- Supply Voltage :
- Logic Type :
-
- ABT Scan Test Device With Transceivers and Registers (5)
- ABT Scan Test Device With Universal Bus Transceivers (16)
- Scan Test Device with Bus Transceivers (7)
- Scan Test Device with Inverting Bus Transceivers (8)
- Scan Test Device with Registered Bus Transceiver (2)
- Scan Test Device With Transceivers And Registers (6)
- TTL/BTL Universal Storage Transceiver (1)
- Applied Filters :
45 results
Picture | Mfr Part # | QUANTITY | Inventory | MANUFACTURE | Description | Package | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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GLOBAL STOCKS | |||||||||||||||||
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RFQ |
3,642
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
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1,099
In-stock
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Texas Instruments | IC 18-BIT TTL/BTL XCVR 100-HLQFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) | 4.5 V ~ 5.5 V | 18 | TTL/BTL Universal Storage Transceiver | ||||
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3,479
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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2,075
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
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3,173
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
|
3,739
In-stock
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Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
|
2,042
In-stock
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
|
930
In-stock
|
Texas Instruments | IC 18BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
|
RFQ |
2,262
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
3,954
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
1,656
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 56TSSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
1,497
In-stock
|
Texas Instruments | IC 18BIT INV BUS TXRX 56-TSSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
2,883
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
3,975
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
|
RFQ |
2,889
In-stock
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | |||
|
3,889
In-stock
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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3,212
In-stock
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
|
3,903
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | ||||
|
1,771
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||||
|
3,544
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
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2,346
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
|
3,989
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
|
RFQ |
2,734
In-stock
|
Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP | - | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | |||
|
2,995
In-stock
|
Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP | - | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
|
3,004
In-stock
|
Texas Instruments | IC ABT SCAN TEST DEV3.3V 64TSSOP | - | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||||
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1,253
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
|
1,851
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||||
|
1,952
In-stock
|
Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
|
854
In-stock
|
Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||||
|
3,631
In-stock
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers |